本标准规定了单晶和铸造多晶的硅片及硅锭的载流子复合寿命的非接触微波反射光电导衰减测试方法。本标准适用于硅锭和经过抛光处理的n型或p型硅片(当硅片厚度大于1 mm时,通常称为硅块)载流子复合寿命的测试。在电导率检测系统灵敏度足够的条件下,本标准也可用于测试切割或经过研磨、腐蚀的硅片的载流子复合寿命。通常,被测样品的室温电阻率下限在0.05 Ω·cm~10 Ω·cm之间,由检测系统灵敏度的极限确定。载流子复合寿命的测试范围为大于0.1 μs,可测的最短寿命值取决于光源的关断特性及衰减信号测定器的采样频率,最长可测值取决于样品的几何条件及其表面的钝化程度。
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This document specifies a method of measuring the twist pitch of Nb-Ti and Nb3Sn composite superconductors,including principle,reagent,tool,specimen preparation,measurement procedure,calculation of results,uncertainty of measurement and test report.
This document is applicable to measuring the twist pitch of multifilamentary Nb-Ti and Nb3Sn composite superconductors with the diameter of 0.2 mm to 2.0 mm (or a rectangle with the equivalent cross-sectional area),the superconducting filament(s) diameter of 6 μm to 200 μm,and the twist pitch of 5 mm to 50 mm. The Nb-Ti and Nb3Sn composite superconductors of this document have monolithic structures with a copper matrix.
This document is not applicable to superconductors with coating that cannot be dissolved by nitric acid.
NOTE 1 If the cross-sectional shape,area,filament diameter and twist pitch of composite superconductor are beyond the above range,the uncertainty of measurement will be increased.
NOTE 2 With appro
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