定价：

The fundamental basis for making a measurement of resolution of a camera system is to reproduce a suitable test chart with the equipment under test. This test chart shall include a pattern that has a sufficient amount of fine detail so that a quantitative observation can be made of the amount of this detail in the reproduced picture. This is usually done by incorporating in the chart a series of lines having graduated widths. The reproduced image of this test chart is then observed on a picture… read more tube or other suitable reproducing device. The point in the picture where the lines are no longer visible as separately defined images gives a measure of the system performance with respect to resolution. A quantitative method of measuring the horizontal resolution response of a camera system is based upon the oscilloscope display of the camera output voltage obtained from any single scan line across the vertical wedges of the resolution chart image. By choosing lines that occur at suitable times, the amplitude of the resulting signal can be plotted as a function of the line number of the chart. read less

定价： 127元 / 折扣价： 108 元

This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both… read more polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user. read less

定价： 102元 / 折扣价： 87 元