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【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) test (IEC 47/1584/CDV:2001); German version prEN 60749-16:2001
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2025-04-30
- DIN EN 60749-16
- 废止
- 定价： 263元
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标准简介适用范围：
暂无
标准号：
DIN EN 60749-16
标准名称：
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) test (IEC 47/1584/CDV:2001); German version prEN 60749-16:2001
英文名称：
标准状态：
废止-
发布日期：
2001-05-01 -
实施日期：
出版语种：
- 其它标准
- 上一篇： DIN EN 60749-15 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/1583/CDV:2001); German version prEN 60749-15:2001
- 下一篇： DIN EN 60749-17 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/1588/CDV:2001); German version prEN 60749-17:2001
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