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【国际标准】 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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标准简介适用范围：
暂无
标准号：
IEC 62374:2007 EN-FR
标准名称：
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
英文名称：
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films标准状态：
现行-
发布日期：
2007-03-29 -
实施日期：
出版语种：
EN-FR
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