【国外标准】 Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of package warpage at elevated temperature and the maximum permissible warpage (IEC 47D/709/CD:2007)
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2025-06-05
- DIN IEC 60191-6-19
- 废止
- 定价:
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标准号:
DIN IEC 60191-6-19
标准名称:
Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of package warpage at elevated temperature and the maximum permissible warpage (IEC 47D/709/CD:2007)
英文名称:
标准状态:
废止-
发布日期:
2001-03-01 -
实施日期:
出版语种:
英语
- 其它标准
- 上一篇: DIN IEC 60191-6-18 Mechanical standardization of semiconductor devices - Part 6-18: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for ball grid array (BGA) (IEC 47D/708/CD:2007)
- 下一篇: DIN EN ISO 19132 Geographic information - Location-based services - Reference model (ISO 19132:2007); English version EN ISO 19132:2008
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