5.1 Analyses using DCP-AES require proper preparation of test solutions, accurate calibration, and control of analytical procedures. ASTM test methods that refer to this guide shall provide specifics on test solutions, calibration, and procedures.5.2 DCP-AES analysis is primarily concerned with testing materials for compliance with specifications, but may range from qualitative estimations to umpire analysis. These may involve measuring major and minor constituents or trace impurities, or both. This guide suggests some approaches to these different analytical needs.5.3 This guide assists analysts in developing new methods.5.4 It is assumed that the users of this guide will be trained analysts capable of performing common laboratory procedures skillfully and safely. It is expected that the work will be performed in a properly equipped laboratory.5.5 This guide does not purport to define all of the quality assurance parameters necessary for DCP-AES analysis. Analysts should ensure that proper quality assurance procedures are followed, especially those defined by the test method. Refer to Guide E882.1.1 This guide covers procedures for using a Direct Current Plasma Atomic Emission Spectrometer (DCP-AES) to determine the concentration of elements in solution. Recommendations are provided for preparing and calibrating the instrument, assessing instrument performance, diagnosing and correcting for interferences, measuring test solutions, and calculating results. A method to correct for instrument drift is included.1.2 This guide does not specify all the operating conditions for a DCP-AES because of the differences between models of these instruments. Analysts should follow instructions provided by the manufacturer of the particular instrument.1.3 This guide does not attempt to specify in detail all of the hardware components and computer software of the instrument. It is assumed that the instrument, whether commercially available, modified, or custom built, will be capable of performing the analyses for which it is intended, and that the analyst has verified this before performing the analysis.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 7.1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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The current gain of a transistor is basic to its operation and is its single most important parameter. Ionizing radiation, that is, gamma radiation due to a nuclear burst, will degrade the current gain due to lifetime damage in the bulk material. Degradation of gain will be greatest immediately following a burst of ionizing radiation and the gain will rapidly recover to a quasi steady-state value. Defect annealing may continue for weeks but usually the current gain recovery is small or negligible. This method provides a procedure that does not require special-purpose test equipment. This method is suitable for use for specification acceptance, service evaluation, or manufacturing control.1.1 This test method covers the measurement of common-emitter d-c current gain (forward, hFE, or inverted, hFEI) of bipolar transistors, for which the collector-emitter leakage current, ICEO, is less than 10% of the collector current, IC, at which the measurement is to be made, and for which the shunt leakage current in the base circuit is less than 10% of the base current required. 1.2 This test method is suitable for measurement of common-emitter d-c current gain at a single given value of test transistor collector current or over a given range of collector currents (for example, over the range of the transistor to be tested). 1.2.1 The nominal ranges of collector current over which the three test circuits are intended to be used are as follows: 1.2.1.1 Circuit 1, less than 100 [mu]A, 1.2.1.2 Circuit 2, from 100 [mu]A to 100 mA, and 1.2.1.3 Circuit 3, greater than 100 mA. 1.3 This test method incorporates tests to determine if the power dissipated in the transistor is low enough that the temperature of the junction is approximately the same as the ambient temperature. 1.4 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address the safety problems, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 Absolute and comparative methods provide a measure for sorting large quantities of nonferrous parts or stock with regard to composition or condition, or both.5.2 The comparative or two-coil method is used when high-sensitivity examination is required. The advantage of this method is that it almost completely suppresses interferences.5.3 The ability to accomplish these types of separations satisfactorily is dependent upon the relation of the electric characteristics of the nonferrous parts to their physical condition.5.4 These methods may be used for high-speed sorting in a fully automated setup where the speed of examination may approach many specimens per second depending on their size and shape.5.5 Successful sorting of nonferrous material depends mainly on the variables present in the sample and the proper selection of frequency and fill factor.5.6 The accuracy of a sort will be affected greatly by the coupling between the test coil field and the examined part during the measuring period.1.1 This practice describes a procedure for sorting nonferrous metals using the electromagnetic (eddy current) method. The procedure is intended for use with instruments using absolute or comparator-type coils for distinguishing variations in mass, shape, conductivity, and other variables such as alloy, heat treatment, or hardness that may be closely correlated with the electrical properties of the material. Selection of samples to evaluate sorting feasibility and to establish standards is also described.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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3.1 This test method provides a satisfactory means of determining various ac magnetic properties of amorphous magnetic materials.3.2 The procedures described herein are suitable for use by producers and users of magnetic materials for materials specification acceptance and manufacturing control.3.3 The procedures described herein may be adapted for use with specimens of other alloys and other toroidal forms.1.1 This test method covers tests for various magnetic properties of amorphous materials at power frequencies [25 to 400 Hz] using a toroidal test transformer. The term “toroidal test transformer” is used to describe the test device, reserving the term “specimen” to refer to the material used in the test. The test specimen consists of toroidally wound flat strip.1.2 This test method covers the determination of core loss, exciting power, rms and peak exciting current, several types of ac permeability, and related properties under ac magnetization at moderate and high inductions at power frequencies [25 to 70 Hz].1.3 With proper instrumentation and specimen preparation, this test method is acceptable for measurements at frequencies from 5 Hz to 100 kHz. Proper instrumentation implies that all test instruments have the required frequency bandwidth. Also see Annex A2.1.4 This test method also provides procedures for calculating impedance permeability from measured values of rms exciting current and for calculating ac peak permeability from measured peak values of total exciting current at magnetic field strengths up to about 10 Oe [796 A/m].1.5 Explanations of symbols and brief definitions appear in the text of this test method. The official symbols and definitions are listed in Terminology A340.1.6 This test method shall be used in conjunction with Practice A34/A34M.1.7 The values and equations stated in customary (cgs-emu and inch-pound) units or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.9 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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This test method is intended to provide a means for evaluating the current-voltage cycling stability at 90°C (194°F) of ECWs as described in 1.2.2 ,4 (See Appendix X1, sections X1.4-X1.7.)1.1 This test method covers the accelerated aging and monitoring of the time-dependent performance of electrochromic windows (ECW). Cross sections of typical electrochromic windows have three to five-layers of coatings that include one to three active layers sandwiched between two transparent conducting electrodes (TCEs, see Section ). Examples of the cross-sectional arrangements can be found in "Evaluation Criteria and Test Methods for Electrochromic Windows." (For acronyms used in this standard, see , section ).1.2 This test method is applicable only for layered (one or more active coatings between the TCEs) absorptive electrochromic coatings on sealed insulating glass (IG) units fabricated for vision glass (superstrate and substrate) areas for use in buildings, such as glass doors, windows, skylights, and exterior wall systems. The layers used for electrochromically changing the optical properties may be inorganic or organic materials between the superstrate and substrate.1.3 The electrochromic coatings used in this test method will be subsequently exposed (see Test Methods E 2141) to solar radiation and deployed to control the amount of radiation by absorption and reflection and thus, limit the solar heat gain and amount of solar radiation that is transmitted into the building.1.4 This test method is not applicable to other chromogenic devices, for example, photochromic and thermochromic devices.1.5 This test method is not applicable to electrochromic windows that are constructed from superstrate or substrate materials other than glass.1.6 This test method referenced herein is a laboratory test conducted under specified conditions. This test is intended to simulate and, possibly, to also accelerate actual in-service use of the electrochromic windows. Results from this test cannot be used to predict the performance with time of in-service units unless actual corresponding in-service tests have been conducted and appropriate analyses have been conducted to show how performance can be predicted from the accelerated aging tests.1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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This test method is intended to provide a means for evaluating the current-voltage cycling stability at ca. 22°C of ECWs as described in 1.2.2 ,4 (See Appendix X1, sections X1.4-X1.7.)1.1 The test described is a method for the accelerated aging and monitoring of the time-dependent performance of electrochromic windows (ECW). Cross sections of typical electrochromic windows have three to five-layers of coatings that include one to three active layers sandwiched between two transparent conducting electrodes (TCEs, see Section ). Examples of the cross-sectional arrangements can be found in "Evaluation Criteria and Test Methods for Electrochromic Windows." (For acronyms used in this standard, see , section ).1.2 The test method is applicable only for layered (one or more active coatings between the TCEs) absorptive electrochromic coatings on sealed insulating glass (IG) units fabricated for vision glass (superstrate and substrate) areas for use in buildings, such as glass doors, windows, skylights, and exterior wall systems. The layers used for electrochromically changing the optical properties may be inorganic or organic materials between the superstrate and substrate.1.3 The electrochromic coatings used in this test method will be subsequently exposed (see Test Methods E 2141) to solar radiation and deployed to control the amount of radiation by absorption and reflection and thus, limit the solar heat gain and amount of solar radiation that is transmitted into the building.1.4 The test method is not applicable to other chromogenic devices, for example, photochromic and thermochromic devices.1.5 The test method is not applicable to electrochromic windows that are constructed from superstrate or substrate materials other than glass.1.6 The test method referenced herein is a laboratory test conducted under specified conditions. This test is intended to simulate and, possibly, to also accelerate actual in-service use of the electrochromic windows. Results from this test cannot be used to predict the performance with time of in-service units unless actual corresponding in-service tests have been conducted and appropriate analyses have been conducted to show how performance can be predicted from the accelerated aging tests.1.7 The values stated in metric (SI) units are to be regarded as the standard.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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4.1 The high-voltage, low-current type of arc resistance test is intended to simulate only approximately such serviceconditions as exist in alternating current circuits operating at high voltage, but at currents limited to units and tens of milliamperes.4.2 In order to distinguish more easily among materials that have low arc resistance, the early stages of this test method are mild, and the later stages are successively more severe. The arc occurs intermittently between two electrodes resting on the surface of the specimen, in normal or inverted orientation. The severity is increased in the early stages by successively decreasing to zero the interval between flashes of uniform duration, and in later stages by increasing the current.4.3 Four general types of failure have been observed:4.3.1 Many inorganic dielectrics become incandescent, whereupon they are capable of conducting the current. Upon cooling, however, they return to their earlier insulating condition.4.3.2 Some organic compounds burst into flame without the formation of a visible conducting path in the substance.4.3.3 Others are seen to fail by “tracking,” that is, a thin wiry line is formed between the electrodes.4.3.4 The fourth type occurs by carbonization of the surface until sufficient carbon is present to carry the current.4.4 Materials often fail within the first few seconds after a change in the severity stage. When comparing the arc resistance of materials, much more weight shall be given to a few seconds that overlap two stages than to the same elapsed time within a stage. Thus, there is a much greater difference in arc resistance between 178 and 182 s than between 174 and 178 s.NOTE 4: Some investigators have reported attempts to characterize the remaining insulating value of the damaged area after failure by allowing the specimen to cool to room temperature, without disturbance of the original position of the electrodes, and then either (1) measuring the insulation resistance between the electrodes or (2) determining the percentage of breakdown voltage remaining relative to that obtained on an undamaged area of the specimen. A recommended circuit arrangement and test procedure for carrying out the second of these two means of characterizing the remaining insulating value of the damaged area is described in Appendix X1. Still another, and obvious, method of reevaluating the damaged area after failure is to repeat the arc resistance test after the specimen has cooled, with the electrodes undisturbed from their original positions. However, keep in mind that none of these methods will be universally applicable because of the severe physical damage to the test area in many instances.1.1 This test method covers, in a preliminary fashion, the differentiation of similar materials’ resistance to the action of a high-voltage, low-current arc close to the surface of insulation, when a conducting path is formed causing the material to become conducting due to the localized thermal and chemical decomposition and erosion.1.2 The usefulness of this test method is very severely limited by many restrictions and qualifications, some of which are described in the following paragraphs and in Section 5. Generally, this test method shall not be used in material specifications. Whenever possible, alternative test methods shall be used, and their development is encouraged.1.3 This test method will not, in general, permit conclusions to be drawn concerning the relative arc resistance rankings of materials that are potentially subjected to other types of arcs: for example, high voltage at high currents, and low voltage at low or high currents (promoted by surges or by conducting contaminants).1.4 The test method is intended, because of its convenience and the short time required for testing, for preliminary screening of material, for detecting the effects of changes in formulation, and for quality control testing after correlation has been established with other types of simulated service arc tests and field experience. Because this test method is usually conducted under clean and dry laboratory conditions rarely encountered in practice, it is possible that the prediction of a material's relative performance in typical applications and in varying “clean to dirty” environments will be substantially altered (Note 1). Caution is urged against drawing strong conclusions without corroborating support of simulated service tests and field testing. Rather, this test method is useful for preliminary evaluation of changes in structure and composition without the complicating influence of environmental conditions, especially dirt and moisture.NOTE 1: By changing some of the circuit conditions described herein it has been found possible to rearrange markedly the order of arc resistance of a group of organic insulating materials consisting of vulcanized fiber and of molded phenolic and amino plastics, some containing organic, and some inorganic, filler.1.5 While this test method uses dry, uncontaminated specimen surfaces, Test Method D2132, Test Methods D2303, and Test Method D3638 employ wet, contaminated specimen surfaces. Their use is recommended for engineering purposes and to assist in establishing some degree of significance to this test method for quality control purposes.21.6 This test method is not applicable to materials that do not produce conductive paths under the action of an electric arc, or that melt or form fluid residues that float conductive residues out of the active test area thereby preventing formation of a conductive path.1.7 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see 6.1.14, 6.1.19, Section 7, and 10.1.1.NOTE 2: Due to the deficiencies covered in Section 1, Committee D09 has proposed that without significant proposed improvements this standard be withdrawn in 2027 during its next 5 year review. This notice is provided so that referencing standards can transition.1.9 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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3.1 Permeameters require the use of yokes to complete the magnetic circuit and are therefore inherently less accurate than ring test methods. Refer to Test Method A596/A596M for further details on ring test methods. However, when testing certain shapes as bars or when magnetic field strength in excess of 200 Oe [16 kA/m] is required, permeameters are the only practical means of measuring magnetic properties. 3.2 This test method is suitable for specification acceptance, service evaluation, research and development and design. 3.3 When the test specimen is fabricated from a larger sample and is in the same condition as the larger sample, it may not exhibit magnetic properties representative of the original sample. In such instances the test results, when viewed in context of past performance history, will be useful for judging the suitability of the material for the intended application. 1.1 This test method provides dc permeameter tests for the basic magnetic properties of soft magnetic materials in the form of bars, rods, wire, or strip specimens which may be cut, machined, or ground from cast, compacted, sintered, forged, extruded, rolled, or other fabricated materials. It includes tests for determination of the normal induction under symmetrically cyclically magnetized (SCM) conditions and the hysteresis loop (B-H loop) taken under conditions of rapidly changing or steep wavefront reversals of the direct current magnetic field strength. This method has been historically referred to as the ballistic test method. For testing hard or permanent magnet materials, Test Method A977/A977M shall be used. 1.2 This test method shall be used in conjunction with Practice A34/A34M. 1.3 This test method covers a range of magnetic field strength in the specimen from about 0.05 Oe [4 A/m] up to above 5000 Oe [400 kA/m] through the use of several permeameters. The separate permeameters cover this test region in several overlapping ranges. 1.4 Normal induction and hysteresis properties may be determined over the magnetic flux density range from essentially zero to the saturation induction for most materials. 1.5 Recommendations of the useful magnetic field strength range for each of the permeameters are shown in Table 1.2 Permeameters particularly well suited for general testing of soft magnetic materials are shown in boldface. Also, see Sections 3 and 4 for general limitations relative to the use of permeameters. 1.6 The symbols and abbreviated definitions used in this test method appear with Fig. 1 and in appropriate sections of this document. For the official definitions, see Terminology A340. Note that the term magnetic flux density used in this document is synonymous with the term magnetic induction. FIG. 1 Basic Circuit Using Permeameter Note 1:  A1—Multirange ammeter (main current) A2—Multirange ammeter (hysteresis current) B—Magnetic flux density test position for Switch S3 F—Electronic Fluxmeter H—Magnetic field strength test position for Switch S3 N1—Magnetizing coil N2—Magnetic flux sensing (B) coil N3—Magnetic field strength (H) sensing coil R1—Main current control rheostat R2—Hysteresis current control rheostat S1—Reversing switch for magnetizing current S2—Shunting switch for hysteresis current control rheostat S3—Fluxmeter selector switch SP—Specimen 1.7 Warning—Mercury has been designated by EPA and many state agencies as a hazardous material that can cause central nervous system, kidney, and liver damage. Mercury, or its vapor, may be hazardous to health and corrosive to materials. Caution should be taken when handling mercury and mercury-containing products. See the applicable product Material Safety Data Sheet (MSDS) for details and EPA’s website (http://www.epa.gov/mercury/faq.htm ) for additional information. Users should be aware that selling mercury or mercury-containing products, or both, in your state may be prohibited by state law. 1.8 The values and equations stated in customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets except for the sections concerning calculations where there are separate sections for the respective unit systems. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this standard. 1.9 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.10 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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3.1 This test method is a fundamental method for evaluating the magnetic performance of flat-rolled magnetic materials in either as-sheared or stress-relief annealed condition.3.2 This test method is suitable for design, specification acceptance, service evaluation, and research and development.1.1 This test method covers tests for the magnetic properties of basic flat-rolled magnetic materials at power frequencies (25 to 400 Hz) using a 25-cm Epstein test frame and the 25-cm double-lap-jointed core. It covers the determination of core loss, rms exciting power, rms and peak exciting current, and several types of ac permeability and related properties of flat-rolled magnetic materials under ac magnetization.1.2 This test method shall be used in conjunction with Practice A34/A34M.1.3 This test method2 provides a test for core loss and exciting current at moderate and high magnetic flux densities up to 15 kG [1.5 T] on nonoriented electrical steels and up to 18 kG [1.8 T] on grain-oriented electrical steels.1.4 The frequency range of this test method is normally that of the commercial power frequencies 50 to 60 Hz. With proper instrumentation, it is also acceptable for measurements at other frequencies from 25 to 400 Hz.1.5 This test method also provides procedures for calculating ac impedance permeability from measured values of rms exciting current and for ac peak permeability from measured peak values of total exciting currents at magnetic field strengths up to about 150 Oe [12 000 A/m].1.6 Explanation of symbols and abbreviated definitions appear in the text of this test method. The official symbols and definitions are listed in Terminology A340.1.7 The values and equations stated in customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets except for the sections concerning calculations where there are separate sections for the respective unit systems. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with this standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.9 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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5.1 This test method for the analysis of fine gold is primarily intended to test such material for compliance with compositional specifications. It is assumed that all who use this test method will be trained analysts capable of performing common laboratory procedures skillfully and safely. It is expected that work will be performed in a properly equipped laboratory and operated in accordance with Guide E882.1.1 This test method covers the analysis of refined gold for the following elements having the following chemical composition limits:Element Content Range, µg/gCopper 17 to 300Iron  6 to 150Lead 17 to 100Palladium  7 to 350Silver 17 to 5001.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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4.1 This test method evaluates the performance of flat-rolled magnetic materials over a wide frequency range of ac excitation with and without incremental dc bias, as used on transformers, motors, and other laminated core devices.4.2 This test method is suitable for design, specification acceptance, service evaluation, and research.4.3 The application of test results obtained with this test method to the design or evaluation of a particular magnetic device must recognize the influence of the magnetic circuitry upon its performance. Some specific items to consider are size, shape, holes, welding, staking, bolting, bracketing, shorting between laminations, ac waveform, adjacent magnetic fields, and stress.1.1 This test method covers the determination of the magnetic properties of flat-rolled magnetic materials using Epstein test specimens with double-lap joints in the 25-cm Epstein frame. It covers determination of core loss, rms and peak exciting current, exciting power, magnetic field strength, and permeability. This test method is commonly used to test grain-oriented and nonoriented electrical steels but may also be used to test nickel-iron, cobalt-iron, and other flat-rolled magnetic materials.1.2 This test method shall be used in conjunction with Practice A34/A34M and Test Method A343/A343M.1.3 Tests under this test method may be conducted with either normal ac magnetization or with ac magnetization and superimposed dc bias (incremental magnetization).1.4 In general, this test method has the following limitations:1.4.1 Frequency—The range of this test method normally covers frequencies from 100 to 10 000 Hz. With proper equipment, the test method may be extended above 10 000 Hz. When tests are limited to the use of power sources having frequencies below 100 Hz, they shall use the procedures of Test Method A343/A343M.1.4.2 Magnetic Flux Density  (may also be referred to as Flux Density)—The range of magnetic flux density for this test method is governed by the test specimen properties and by the available instruments and other equipment components. Normally, for many materials, the magnetic flux density range is from 1 to 15 kG [0.1 to 1.5 T].1.4.3 Core Loss and Exciting Power—These measurements are normally limited to test conditions that do not cause a test specimen temperature rise in excess of 50°C or exceed 100 W/lb [220 W/kg].1.4.4 Excitation—Either rms or peak values of exciting current may be measured at any test point that does not exceed the equipment limitations provided that the impedance of the ammeter shunt is low and its insertion into the test circuit does not cause appreciably increased voltage waveform distortion at the test magnetic flux density.1.4.5 Incremental Properties—Measurement of incremental properties shall be limited to combinations of ac and dc excitations that do not cause secondary voltage waveform distortion, as determined by the form factor method, to exceed a shift of 10 % away from sine wave conditions.1.5 The values and equations stated in customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets except for the sections concerning calculations where there are separate sections for the respective unit systems. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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4.1 General—Most thickness gauges are not applicable to all combinations of coating-substrate thicknesses and materials. The limitations of a particular instrument are generally delineated by its manufacturer. The substrate material and coating combination to be measured as well as the inherent variations in the substrate and coating shall be reviewed prior to selecting the instrument to be used and the measurement accuracy required.4.2 Magnetic—Magnetic-type gauges measure either magnetic attraction between a magnet and a coating or its substrate, or reluctance of a magnetic flux path passing through the coating and substrate. These gauges are designed to measure thickness of a nonmagnetic coating on a magnetic substrate. Some of them will also measure thickness of nickel coatings on a magnetic or nonmagnetic substrate.64.3 Eddy Current—Eddy current-type thickness gauges are electronic instruments that measure variations in impedance of an eddy current inducing coil caused by coating thickness variations. They can only be used if the electrical conductivity of the coating differs significantly from that of the substrate.4.4 Accuracy—The accuracy of a measurement depends on the instrument, the foils, its calibration and standardization, and its operating conditions. The accuracy is also affected by the interferences listed in Section 5, such as part geometry (curvature), magnetic permeability, electrical conductivity, and surface roughness.NOTE 2: This practice under ideal conditions may allow the coating thickness to be determined within ±10 % of its true thickness or to within ±2.5 μm (or ±0.0001 in.), whichever is the greater. (See exceptions in Appendix X2.)1.1 This practice covers the use of magnetic- and eddy current-type thickness instruments (gauges) for nondestructive thickness measurement of a coating on a metal (that is, electrically conducting) substrate. The substrate may be ferrous or nonferrous. The coating or plating being measured may be electrically conducting or insulating as well as ferrous or non-ferrous.1.2 More specific uses of these instruments are covered by Practice D7091 and the following test methods issued by ASTM: Test Methods B244, B499, and B530.1.3 Units—The values stated in SI units are to be regarded as standard. The values given in parentheses are mathematical conversions to inch-pound units that are provided for information only and are not considered standard.1.4 Measurements made in accordance with this practice will be in compliance with the requirements of ISO 2178 as printed in 1982.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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3.1 This test method is a derivative of Test Method A697/A697M specifically designed for testing of toroidal cores which are not covered in Test Method A697/A697M and for testing at magnetic flux densities above the knee of the magnetization curve.3.2 Specimen size typically ranges from 1 in. to 1.25 in. [25.4 mm to 31.8 mm] in inside diameter to 1.5 in. [38.1 mm] in outside diameter with weights ranging from 30 g to 60 g. Provided the test equipment is suitably chosen, there is no obvious limit to the overall size of core that can be tested. If basic material properties are desired, then the requirements of 5.1 must be observed.3.3 The reproducibility and repeatability of this test method are such that this test method is suitable for design, specification acceptance, service evaluation, and research and development.3.4 When testing under sinusoidal flux conditions at magnetic flux densities approaching saturation, highly peaked magnetizing waveforms will be present, and the test instruments used must have crest factor capabilities of at least 3; otherwise erroneous results will be obtained.1.1 This test method covers the determination of several ac magnetic properties of either laminated ring or toroidal tape wound cores made from flat rolled product.1.2 This test method covers test equipment and procedures for determination of specific core loss, specific exciting power, and peak permeability for power and audio frequencies (50 Hz to 20 000 Hz) under sinusoidal flux conditions.1.3 This test method, because of the use of a feedback-controlled power amplifier, is well suited for determination of ac magnetic properties at magnetic flux densities above the knee of the magnetization curve and is particularly useful for testing of high-saturation iron-cobalt alloys (for example, alloys listed in Specification A801), although use of this test method is not restricted to a particular type of material.1.4 This test method shall be used in conjunction with Practice A34/A34M and Terminology A340.1.5 The values stated in either SI units or inch-pound units are to be regarded separately as standard. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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4.1 This test method provides a satisfactory means of determining various ac magnetic properties of amorphous magnetic materials. It was developed to supplement the testing of toroidal and Epstein specimens. For testing toroidal specimens of amorphous materials, refer to Test Method A912/A912M.4.2 The procedures described herein are suitable for use by manufacturers and users of amorphous magnetic materials for materials specification acceptance and manufacturing control.NOTE 2: This test method has been principally applied to the magnetic testing of thermally, magnetically annealed, and flattened amorphous strip at 50 and 60 Hz. Specific core loss at 13 or 14 kG [1.3 or 1.4 T], specific exciting power at 13 or 14 kG [1.3 or 1.4 T], and the flux density, B, at 1 Oe [79.6 A/m] are the recommended parameters for evaluating power grade amorphous materials.1.1 This test method covers tests for various magnetic properties of flat-cast amorphous magnetic materials at power frequencies (50 and 60 Hz) using sheet-type specimens in a yoke-type test fixture. It provides for testing using either single- or multiple-layer specimens.NOTE 1: This test method has been applied only at frequencies of 50 and 60 Hz, but with proper instrumentation and application of the principles of testing and calibration embodied in the test method, it is believed to be adaptable to testing at frequencies ranging from 25 to 400 Hz.1.2 This test method provides a test for specific core loss, specific exciting power and ac peak permeability at moderate and high flux densities, but is restricted to very soft magnetic materials with dc coercivities of 0.07 Oe [5.57 A/m] or less.1.3 The test method also provides procedures for calculating ac peak permeability from measured peak values of total exciting currents at magnetic field strengths up to about 2 Oe [159 A/m].1.4 Explanation of symbols and abbreviated definitions appear in the text of this test method. The official symbols and definitions are listed in Terminology A340.1.5 This test method shall be used in conjunction with Practice A34/A34M.1.6 The values stated in either customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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5.1 The purpose of the alternating current field measurement method is to evaluate welds for surface breaking discontinuities such as fabrication and fatigue cracks. The examination results may then be used by qualified organizations to assess weld service life or other engineering characteristics (beyond the scope of this practice). This practice is not intended for the examination of welds for non-surface breaking discontinuities.1.1 This practice describes procedures to be followed during alternating current field measurement examination of welds for baseline and service-induced surface breaking discontinuities.1.2 This practice is intended for use on welds in any metallic material.1.3 This practice does not establish weld acceptance criteria.1.4 Units—The values stated in either inch-pound units or SI units are to be regarded separately as standard. The values stated in each system might not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with the standard.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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